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2 367 Results
From dependable computing systems to computing for integrated dependable systems?FTCS: Fault-Tolerant Computing Symposium, Jun 1998, Munich, Germany. pp.296-301, ⟨10.1109/FTCS.1998.689480⟩
Conference papers
hal-00013844v1
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SEU testing of a novel hardened register implemented using standard CMOS technologyIEEE Transactions on Nuclear Science, 1999, 46 (6), pp.1440-1444. ⟨10.1109/23.819105⟩
Journal articles
hal-00008234v1
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Architectures des Accélérateurs de Traitement Flexibles pour les Systèmes sur PuceMicro et nanotechnologies/Microélectronique. Université Montpellier II - Sciences et Techniques du Languedoc, 2004. Français. ⟨NNT : ⟩
Theses
tel-00007352v1
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Une Famille d'Additionneur Asynchrones CMOS à Temps de Calcul Dépendant de DonnéesJNRDM: Journées Nationales du Réseau Doctoral de Microélectronique, May 2006, Rennes, France. pp.469-472
Conference papers
lirmm-00102842v1
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Study of a Multi-Chip Circuit under CDM Stress06024, 2006, 20 p
Reports
lirmm-00102726v1
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Interconnect Pitch for New Generation: Evolution due to Inductive ImpactIEEE Workshop on Signal Propagation on Interconnects, May 2006, Berlin, Germany. pp.193-196
Conference papers
lirmm-00102769v1
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Victim and Aggressor Line Electrical Modelisation in an Multicoupled Interconnect Environment for Transient SimulationSPI: Signal Propagation on Interconnects, May 2006, Berlin, Germany. pp.249-251, ⟨10.1109/SPI.2006.289235⟩
Conference papers
lirmm-00102776v1
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Conception d'un FPGA Reconfigurable Dynamiquement à la Mémoire de Reconfiguration Non Volatile MagnétiqueJNRDM: Journées Nationales du Réseau Doctoral de Microélectronique, May 2006, Rennes, France
Conference papers
lirmm-00102780v1
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Compression de Données de Test : Réduction du Nombre de Broches et Gain en Temps de TestJNRDM: Journées Nationales du Réseau Doctoral de Microélectronique, May 2006, Rennes, France
Conference papers
lirmm-00102830v1
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An Efficient Scan Tree Design for Test Time ReductionETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.174-179, ⟨10.1109/ETSYM.2004.1347657⟩
Conference papers
lirmm-00108901v1
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Digital and Analog System Testing: Fundamentals and New ChallengesICM'04: 16th International Conference on Microelectronics, Dec 2004, Tunis (Tunisia), pp.8-10
Conference papers
lirmm-00108936v1
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Crosstalk Evaluation: The Influence of Inductance and Routing OrientationICM: International Conference on Microelectronics, Dec 2004, Tunis, Tunisia. pp.185-188, ⟨10.1109/ICM.2004.1434241⟩
Conference papers
lirmm-00108937v1
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Design of CMOS MEMS Based on Mechanical Resonators Using a RF Simulation ApproachIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2004, 23 (6), pp.962-967. ⟨10.1109/TCAD.2004.828113⟩
Journal articles
lirmm-00108542v1
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HDL Simulation of a Thermal Accelerometer for System DesignXX EUROSENSORS, Sep 2006, Göteborg (Sweden)
Conference papers
lirmm-00102170v1
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Design of a CMOS Micro Compass2nd PATENT-DfMM Summer School, Sep 2005
Conference papers
lirmm-00106561v1
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Test Engineering Education in Europe: The CRTC Experience Through the EuNICE-Test ProjectAchim Rettberg and Christophe Bobda. IFIP TC10 Working Conference: EduTech'05, Oct 2005, France. , pp.63-77, 2005
Conference poster
lirmm-00106564v1
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Optimization Protocol Based on Low Power MetricsIWLS: International Workshop on Logic Synthesis, Jun 2005, Lake Arrowhead Resort, CA, United States. pp.288-293
Conference papers
lirmm-00106018v1
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Test Application Time Reduction with a Dynamically Reconfigurable Scan Tree Architecture8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Apr 2005, Sopron, Hungary. pp.19-26
Conference papers
lirmm-00105987v1
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Efficient AES Implementation for Better Resource Usage and Performance of IoTsCYBER 2020 - 5th International Conference on Cyber-Technologies and Cyber-Systems, Oct 2020, Nice, France
Conference papers
hal-02979423v1
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Implementation of Rowhammer Effect in gem5Conference poster hal-03284443v1 |
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Non Volatile MRAM-based Asynchronous PROCessor2021
Other publications
lirmm-03179090v1
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Towards Improvement of Mission Mode Failure Diagnosis for System-on-ChipIOLTS 2019 - 25th International Symposium on On-Line Testing And Robust System Design, Jul 2019, Rhodes, Greece. pp.21-26, ⟨10.1109/IOLTS.2019.8854388⟩
Conference papers
lirmm-02395493v1
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Special Issue: Field Effect Transistor based Biosensing: Development and ApplicationsBiosensors, 2021
Special issue
lirmm-03024023v1
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Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low Power and Low-Orbit Aerospace ApplicationsIEEE Transactions on Aerospace and Electronic Systems, 2020, 56 (5), pp.3931-3940. ⟨10.1109/TAES.2020.2982341⟩
Journal articles
lirmm-03031912v1
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Analyzing the Use of Taylor Series Approximation in Hardware and Embedded Software for Good Cost-Accuracy Tradeoffs14th International Symposium on Applied Reconfigurable Computing (ARC 2018), May 2018, Santorini, Greece. pp.647-658, ⟨10.1007/978-3-319-78890-6_52⟩
Conference papers
lirmm-03127660v1
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XbarGen: A memristor based boolean logic synthesis toolIFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Sep 2016, Tallinn, Estonia. ⟨10.1109/VLSI-SoC.2016.7753567⟩
Conference papers
hal-03094562v1
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A Secure Scan Controller for Protecting Logic LockingIOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-6, ⟨10.1109/IOLTS50870.2020.9159730⟩
Conference papers
lirmm-02995199v1
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Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM ArchitecturesJNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France
Conference papers
lirmm-00806827v1
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A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to NeutronsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Conference papers
lirmm-00805163v1
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Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS TransistorNSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4
Conference papers
lirmm-00805275v1
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