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Investigations of the ionizing radiation induced effects in ultra-thin strained-silicon layers on insulator using confocal microscopy measurementsJournal of Non-Crystalline Solids, 2011, 357, pp.1989-1993. ⟨10.1016/j.jnoncrysol.2010.12.072⟩
Journal articles
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ujm-00587483v1
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