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authFullName_s : C. Tabone

Investigations of the ionizing radiation induced effects in ultra-thin strained-silicon layers on insulator using confocal microscopy measurements

M. Gaillardin , Sébastien Girard , Y. Ouerdane , A. Boukenter , F. Andrieu , et al.
Journal of Non-Crystalline Solids, 2011, 357, pp.1989-1993. ⟨10.1016/j.jnoncrysol.2010.12.072⟩
Journal articles istex ujm-00587483v1