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Investigations of MGy ionizing dose effects induced in thin oxides of micro-electronic devicesAdvancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA 2015), IEEE, Apr 2015, Lisbonne, Portugal
Conference papers
ujm-01185894v1
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Investigations on the Vulnerability of Advanced CMOS Technologies to MGy Dose EnvironmentsIEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2590 - 2597. ⟨10.1109/TNS.2013.2249095⟩
Journal articles
ujm-00854044v1
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High Total Ionizing Dose and Temperature Effects on Micro- and Nano-electronic DevicesANIMMA 2013, Jun 2013, Marseille, France. pp.XX
Conference papers
ujm-00845006v1
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High Total Ionizing Dose and Temperature Effects on Micro- and Nano-Electronic DevicesIEEE Transactions on Nuclear Science, 2015, 62 (3), pp.1226-1232. ⟨10.1109/TNS.2015.2416975⟩
Journal articles
ujm-01185904v1
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