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authFullName_s : Jean-Luc Leray

Investigations of MGy ionizing dose effects induced in thin oxides of micro-electronic devices

M. Gaillardin , Vincent Goiffon , Philippe Paillet , Melanie Raine , Sylvain Girard , et al.
Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA 2015), IEEE, Apr 2015, Lisbonne, Portugal
Conference papers ujm-01185894v1

Investigations on the Vulnerability of Advanced CMOS Technologies to MGy Dose Environments

M. Gaillardin , Sylvain Girard , Philippe Paillet , Jean-Luc Leray , V. Goiffon , et al.
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2590 - 2597. ⟨10.1109/TNS.2013.2249095⟩
Journal articles ujm-00854044v1

High Total Ionizing Dose and Temperature Effects on Micro- and Nano-electronic Devices

M. Gaillardin , Martial Martinea , Sylvain Girard , V. Goiffon , P. Paillet , et al.
ANIMMA 2013, Jun 2013, Marseille, France. pp.XX
Conference papers ujm-00845006v1
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High Total Ionizing Dose and Temperature Effects on Micro- and Nano-Electronic Devices

M. Gaillardin , Martial Martinez , Sylvain Girard , Vincent Goiffon , Philippe Paillet , et al.
IEEE Transactions on Nuclear Science, 2015, 62 (3), pp.1226-1232. ⟨10.1109/TNS.2015.2416975⟩
Journal articles ujm-01185904v1