Conference Papers
Year : 2008
Manuel Flury : Connect in order to contact the contributor
https://ujm.hal.science/ujm-00290782
Submitted on : Thursday, June 26, 2008-2:38:13 PM
Last modification on : Wednesday, September 20, 2023-1:10:03 PM
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- HAL Id : ujm-00290782 , version 1
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Manuel Flury, Gilles Patriache, David Troadec, Olivier Parriaux. TEM analysis of ion plated HfO2/SiO2 multilayers for femtosecond lasers. 7th Symposium SiO2, advanced dielectrics and related devices, Jul 2008, Saint-Etienne, France. ⟨ujm-00290782⟩
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