@article{gaillardin:ujm-00587483, TITLE = {{Investigations of the ionizing radiation induced effects in ultra-thin strained-silicon layers on insulator using confocal microscopy measurements}}, AUTHOR = {Gaillardin, M. and Girard, S{\'e}bastien and Ouerdane, Y. and Boukenter, A. and Andrieu, F. and Tabone, C. and Faynot, O.}, URL = {https://ujm.hal.science/ujm-00587483}, JOURNAL = {{Journal of Non-Crystalline Solids}}, PUBLISHER = {{Elsevier}}, VOLUME = {357}, PAGES = {1989-1993}, YEAR = {2011}, MONTH = Feb, DOI = {10.1016/j.jnoncrysol.2010.12.072}, KEYWORDS = {Strained silicon ; Radiation ; Confocal microscopy}, HAL_ID = {ujm-00587483}, HAL_VERSION = {v1}, }