Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2011

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Philippe Paillet
Sylvain Girard
A. Bournel

Résumé

Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.

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Dates et versions

ujm-01011676 , version 1 (24-06-2014)

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Melanie Raine, M. Gaillardin, Philippe Paillet, O. Duhamel, Sylvain Girard, et al.. Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices. IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2664 - 2672. ⟨10.1109/TNS.2011.2172985⟩. ⟨ujm-01011676⟩
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