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Journal Articles Microwave and Optical Technology Letters Year : 2019

Measurement of the electromagnetic properties of thin‐films using a microwave resonant cavity

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ujm-02021941 , version 1 (16-02-2019)

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Radwan Dib, Didier Vincent, Ahmad Elrafhi. Measurement of the electromagnetic properties of thin‐films using a microwave resonant cavity. Microwave and Optical Technology Letters, 2019, 61 (1), pp.15-19. ⟨10.1002/mop.31499⟩. ⟨ujm-02021941⟩
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