Journal Articles
International journal of advanced research
Year : 2019
Bernard Bayard : Connect in order to contact the contributor
https://ujm.hal.science/ujm-02054770
Submitted on : Saturday, March 2, 2019-10:22:29 AM
Last modification on : Friday, March 24, 2023-2:53:09 PM
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A Moungache, B. Bayard, S. Robert. Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm. International journal of advanced research, 2019, 7 (1), pp.994-1001. ⟨10.21474/IJAR01/8413⟩. ⟨ujm-02054770⟩
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