Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm - Université Jean-Monnet-Saint-Étienne Access content directly
Journal Articles International journal of advanced research Year : 2019

Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm

A Moungache
  • Function : Author
B. Bayard
S. Robert

Dates and versions

ujm-02054770 , version 1 (02-03-2019)

Identifiers

Cite

A Moungache, B. Bayard, S. Robert. Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm. International journal of advanced research, 2019, 7 (1), pp.994-1001. ⟨10.21474/IJAR01/8413⟩. ⟨ujm-02054770⟩
53 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More