Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift - Université Jean-Monnet-Saint-Étienne Access content directly
Journal Articles Thin Solid Films Year : 2020

Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift

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ujm-02861487 , version 1 (16-06-2022)

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Quentin Cridling, Renée Charrière, D. Jamon, Matthieu Lenci, Mariapia Pedeferri, et al.. Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift. Thin Solid Films, 2020, pp.138181. ⟨10.1016/j.tsf.2020.138181⟩. ⟨ujm-02861487⟩
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