Electrical growth of metallic nanoparticles in mesoporous silica films using atomic force microscopy
Résumé
We report the formation of silver nanoparticles in mesoporous silica films under a polarized micro-tip. By applying a bias voltage between an atomic force microscope conductive tip and an indium tin oxide substrate, reduction of silver ions initially impregnated in a mesoporous silica film occurs and leads to the creation of silver nanoparticles. This technique allows both the precise positioning of the nanoparticles via the control of the tip position and the control of the nanoparticles size by varying the bias voltage applied to the tip or the contact time.