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Journal Articles Microwave and Optical Technology Letters Year : 2011

Characterization of material anisotropy using microwave ellipsometry

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ujm-00802509 , version 1 (20-03-2013)

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  • HAL Id : ujm-00802509 , version 1

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Frank Gambou, Bernard Bayard, Gérard Noyel. Characterization of material anisotropy using microwave ellipsometry. Microwave and Optical Technology Letters, 2011, 53 (9), pp.1996-1998. ⟨ujm-00802509⟩
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