A New Broad-Band Method for Magnetic Thin-Film Characterization in the Microwave Range - Université Jean-Monnet-Saint-Étienne Access content directly
Journal Articles IEEE Transactions on Microwave Theory and Techniques Year : 2005

A New Broad-Band Method for Magnetic Thin-Film Characterization in the Microwave Range

D. Vincent
  • Function : Author
  • PersonId : 857596
T. Rouiller
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C. R. Simovski
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Gérard Noyel
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  • PersonId : 853546
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ujm-00802549 , version 1 (20-03-2013)

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  • HAL Id : ujm-00802549 , version 1

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D. Vincent, T. Rouiller, C. R. Simovski, Bernard Bayard, Gérard Noyel. A New Broad-Band Method for Magnetic Thin-Film Characterization in the Microwave Range. IEEE Transactions on Microwave Theory and Techniques, 2005, 53 (4), pp.1174-1180. ⟨ujm-00802549⟩
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