Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments - Université Jean-Monnet-Saint-Étienne Access content directly
Journal Articles IEEE Transactions on Nuclear Science Year : 2013

Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments

Abstract

A modeling approach is proposed to predict the transient and permanent degradation of image sensors in complex radiation environments. The example of the OMEGA facility is used throughout the paper. A first Geant4 simulation allows the modeling of the radiation environment (particles, energies, timing) at various locations in the facility. The image sensor degradation is then calculated for this particular environment. The permanent degradation, i.e. dark current increase, is first calculated using an analytical model from the literature. Additional experimental validations of this model are also presented. The transient degradation, i.e. distribution of perturbed pixels, is finally simulated with Geant4 and validated in comparison with experimental data.

Domains

Electronics

Dates and versions

ujm-00925534 , version 1 (08-01-2014)

Identifiers

Cite

Melanie Raine, Vincent Goiffon, Sylvain Girard, A. Rousseau, M. Gaillardin, et al.. Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments. IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4297 - 4304. ⟨10.1109/TNS.2013.2284798⟩. ⟨ujm-00925534⟩
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