X-Ray Fault Injection on Power OFF devices
Résumé
For several years, electronic components have taken an increasingly
important place. Their security has become an important matter as they
can contain sensitive data. To assess their security new means of attack
were set up. X-ray effects on electronic devices have been studied for space
applications but only a few recent papers deal with the security point of
view. The state of the art shows that X-ray can easier have an effect on
power off device in contrast to other means of fault injection like laser
injection or electromagnectic waves injection.
This presentation gives practical results on X-ray fault injection campaign on power off devices. We mainly focus on microcontroller embedded
non-volatile memory. This study shows that it is possible to corrupt the
content of unpowered memories with an X-ray source. A fault model is
proposed according to the results of experimental campaign. A thermal
recuperation is also highlighted