Fourier Ptychography Microscopy for Rapid Characterization of Ultrafast Irradiated Surfaces - Université Jean-Monnet-Saint-Étienne Accéder directement au contenu
Communication Dans Un Congrès Année : 2023

Fourier Ptychography Microscopy for Rapid Characterization of Ultrafast Irradiated Surfaces

Fichier non déposé

Dates et versions

ujm-04250424 , version 1 (19-10-2023)

Identifiants

Citer

Ninfa del Carmen Lozano, Nicolas Faure, Xxx Sedao, Razvan Stoian, Corinne Fournier, et al.. Fourier Ptychography Microscopy for Rapid Characterization of Ultrafast Irradiated Surfaces. 2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), Jun 2023, Munich, Germany. pp.1-1, ⟨10.1109/CLEO/Europe-EQEC57999.2023.10232803⟩. ⟨ujm-04250424⟩
7 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More